ionTOF TOF.SIMS 5

IonTof TOF.SIMS5

  • Primary Ion Sources
    • Bismuth Liquid Metal Ion Source (Bi-LMIS)
    • Argon Cluster Ion Source
  • Mass Analyzer
    • Reflectron ToF
      • Resolution: > 10,000 m/Δm
  • Spatial Resolution: <300 nm
  • Applications
    • High Resolution Chemical Imaging
    • Depth Profiling
    • Small Molecule Characterization

Manufacturer's Website:
www.iontof.com/products-tofsims5-IONTOF-TOF-SIMS-TIME-OF-FLIGHT-SURFACE-ANALYSIS.htm